屏蔽效应对氦原子(e,2e)反应中二重微分截面和单微分截面的影响

Influence of screening effect on double differential cross section and single differential cross section for(e, 2e) process of helium

用DS3C模型计算了入射能为32.5,36.5,40.7 eV时电子入射单电离氦原子的二重微分散射截面,并把计算结果与实验结果进行了比较,对屏蔽效应进行了分析.通过对二重微分散射截面在全空间的角度积分得到了电子入射单电离氦原子的单微分散射截面,利用3C模型和DS3C模型计算了入射能为32.5,36.5,40.7,50 eV时氦原子的单微分散射截面,并把计算结果与实验结果进行了比较.对截面的结构进行了分析,并系统研究了交换效应对截面的贡献.

The double differential cross sections for electron impact single ionization of helium at incident energies of 32.5, 36.5 and 40.7 eV are calculated by using the DS3C model. The calculated results are compared with the experimental date. The exchange effects are discussed. The single differential cross section for electron impact single ionization of helium is obtained by integrating the double differential cross sections over the angle of the ejected electron. The single differential cross sections of helium at incident energies of 32.5, 36.5, 40.7 and 50 eV are calculated by using the 3C model and the DS3C model. The calculated results are compared with the experimental date. The structure of the cross section is analysed and the contribution of exchange effect to the corss section is discussed.