摘要
智能电能表用计量芯片失效将引起整表计量的误差,本文通过对一例计量芯片失效现象进行分析,逐步找到失效点及判定失效模式,提出计量芯片失效分析的方法及流程,对设计人员发现设计上的缺陷、工艺参数不匹配等问题进行建议,提高计量芯片的可靠性,从根本上提高智能电能表的质量。
Smart meter metering chip failure will cause the measurement error of the entire table. This paper through the analysis of one case metering chip failure, gradually find the failure point and then determine the failure mode. The method can help the designer find out the design defect and the technological parameter which can improve the metering chip responsibility. Thus can increase the smart meter quality primarily.
出处
《电子测试》
2013年第9期95-96,28,共3页
Electronic Test
