一种新的的模拟集成电路故障诊断方法

A New Fault Diagnosis Method for Analog Integrated Circuit

针对现有模拟集成电路BIST设计需占用大量电路资源的不足,首次从幅频特性分析的角度提出一种基于脉冲测试技术的模拟集成电路嵌入式测试方案;从理论上对激励信号和特征频率的确定方法展开分析,给出并证明了测试参数最优化选择策略;该方案无需增加辅助电路,仅利用控制器内部资源实现测试,提高了测试可靠性并节省了硬件成本开销,此外,频域分析消除了输入输出信号必须同步的限制;实验结果表明,该方法诊断速度快,诊断正确率可达到90%。

A feature of existing BIST of analog integrated circuit is hardware excess. To solve this problem a new approach of embedded test in amplitude--frequency characteristics based on pulse testing technology is proposed for the first time in this paper. The optimization selection strategy of test parameters is given and proved in theoretical. The proposed scheme provides self--testing with the processor internal resources. Therefore, the hardware cost is reduced in higher degree and the test reliability is improved at the same time. Furthermore, fre- quency domain analysis eliminates the limitations that the input/output signals must be synchronized. Experimental results demonstrate the diagnosis is fast and accurate rate up to 90%.