高纯氖气中微量氦分析的影响因素

Impact factor on trace helium analysis in high purity neon

针对工业上高纯氖气中存在的微量氦,进行了一系列的研究实验,通过考察实验条件探索实验的规律性,以适应国家标准对纯氖中杂质含量的新要求。实验中使用了三台气相色谱GC-122、GC-14B、GC-14C,测量相同样品,并考察了桥电流、柱箱温度、载气体积流量等因素对氖气中氦分析的影响。结果表明,桥电流对检测器灵敏度的影响最为显著,柱温和载气体积流量则影响氢气和氦气的分离。进样器及气路的气密性对实验结果的准确性也存在重要的影响。

A series of experiments for trace helium in the industrial high pure neon has been carried out to meet the new requirements of national standards on the content of impurities in pure neon. Three sets of gas chromatography GC-122, GC-14B, and GC-14C were used to measure the same sample, and the influence of current bridge, oven temperature and carrier gas flow on the helium analysis in neon was investigated. The bridge current showed the significant effect on the sensitivity of the detector. Oven temperature and carrier gas flow affected the separation between hydrogen and helium. The air tightness of sample injector and gas path system also is the important factor on the experimental accuracy.