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应用输入向量约束的门替换方法缓解电路老化 被引量：3

Gate Replacement with Input Vector Constraint to Mitigate Circuit Aging
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摘要 为缓解负偏置温度不稳定性(negative bias temperature instability,NBTI)效应引起的电路老化,提高电路可靠性,提出一种在电路待机状态下应用输入向量约束的门替换方法.运用动态和静态的NBTI模型进行感知NBTI的静态时序分析,确定潜在关键路径,考虑路径相关性的关键门算法以确定关键门,并生成能使关键门最大限度处于恢复阶段的输入向量.对输入向量无法控制的关键门采用门替换方法进行内部控制.对ISCAS标准电路的实验结果表明,电路时序余量为5%时,该方法的平均门替换率降低到9.68%,时延改善率提高到39.65%. To mitigate NBTI-induced circuit aging and enhance circuit reliability, gate replacement with input vector constraint during standby is proposed. The potential critical paths are found by using dynamic and static NBTI-aware static timing analysis. The critical gates are then found by considering path correlation. An input vector is generated to make the critical gates in a recovery phase to the largest extent. Gate replacement is applied to the critical gates beyond control. Experiment results with ISCAS benchmark circuit demonstrate that the average gate replacement rate is reduced to 9.68%, and the average delay improvement is increased to 39.65% with the circuit timing margin 5%.
作者 李扬 梁华国 陶志勇
机构地区 合肥工业大学计算机与信息学院 江苏商贸职业学院信息系 合肥工业大学电子科学与应用物理学院
出处 《应用科学学报》 CAS CSCD 北大核心 2013年第5期537-543,共7页 Journal of Applied Sciences
基金 国家自然科学基金(No.61274036 No.61371025 No.61300212 No.61306049) 教育部博士点基金(No.20110111120012) 江苏省高校"青蓝工程"项目基金(No.2010121312)资助
关键词 电路老化 NBTI 输入向量 门替换 circuit aging, NBTI, input vector, gate replacement
分类号 TP391.7 [自动化与计算机技术—计算机应用技术]
  • 相关文献

参考文献18

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同被引文献16

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应用科学学报
2013年 第5期

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