硬X光弯晶谱仪的定量化标定方法

Quantitative calibration research of hard X-ray bent crystal spectrometer

介绍了具有定量化测量能力的硬X光弯晶谱仪的结构,利用Mo靶X光管的K特征线作为标定源,使用绝对标定过的Si(Li)探测器对X光管出射的特征线谱进行强度和谱测量。结合X光管空间分布均匀的特点,计算进入弯晶谱仪的光子数目,采取了特征谱扣去轫致谱的计数处理方法,得到了17keV和19keV处弯晶谱仪的绝对效率,分别为4.32×10-4和3.94×10-4。

A novel hard X-ray bent crystal spectrometer, composed of a cylindrically bent crystal, a specula CsI（T1） scintil- lator, an image intensifier and a CCD, were proposed, which had the quantitative measurement ability. The details of a quantita- tive calibration method using X-ray tube and Si（Li） detector was explained. The absolute efficiency of the spectrometer on 17 keV and 19 keV was calibrated using the method. The results indicated that the efficiency on both energy was coherent in dimension. Several issues which might ameliorate the calibration method were discussed.