一种基于参考切片相容的测试数据压缩方法

A Method Based on Reference Slice Compatibility for Test Data Compression

为了减少集成电路测试数据量,本文提出一种基于参考切片相容的广播式编码压缩方法。以使用两个扫描切片作为参考切片为例介绍了对该编码方法进行了介绍。当测试图形的切片与参考切片直接相容或移位相容时,仅使用3或5比特长度的码字对其编码以实现压缩;提出一种参考切片无关位回溯赋值的方法以保证一致性。针对所提出的编码压缩方案设计了相应的解压缩电路。通过实验数据证实了该方案的有效性。

Aiming at reducing test data storage volume, this paper proposes a broadcast coding method based on reference slice compatibility. Firstly the paper takes using two reference slices for example in order to introduce the method. If a scan slice is compatible with either of the slice or either＇ s ＂Shift - One - Bit＂ result, it can be coded with only three or five bits ; it also proposes a backtracking method to assign the don＇ t - care bits in the reference slices to guarantee the coherence. Then a decompression circuit corresponding to the proposed scheme is designed. At last, the simulation result validities the proposed method.