控制输入跟踪算法和测试衍生算法

The Test Pattern Generation of Orient Single Path Propagation

以组合电路的满足性测试生成算法为基础 ,提出了控制输入跟踪算法和测试衍生算法。控制输入跟踪算法从源输出开始 ,根据一定的指导策略 ,向源输入搜索 ,在搜索过程中生成一条临界路径 ,该路径中全部的故障可以用满足临界条件的输入向量来测试。测试衍生则利用一个测试的信息 ,通过临界路径变换衍生一系列新的测试。这两种算法嵌入测试生成的满足性算法中 ,大大减少了故障 ,压缩了CNF的构成时间和搜索空间。

The paper proposes controlling input values tracing algorithm and test derivation algorithm based on test pattern generation using satisfiability. According to certain strategy, controlling input values tracing algorithm is used to search for a critical path from primary inputs. The fault of critical path can be tested by patterns that satisfy critical conditions. Test derivation can make full use of the pattern generation information from last pattern to derive a set of new tests by means or critical path transitions. Experimental results for stuck-at test pattern generation demonstrate that test pattern generation time and quality are improved by new approaches.\;