边界扫描测试优化算法——极小权值-极大相异性算法

Minimum-weight & Maximum-difference Algorithm in Boundary Scan Test Generation

IEEE 1149.1边界扫描机制是一种新型的VLSI电路测试及可测试性设计方法 ,在边界扫描测试过程中 ,生成合理的测试向量集是有效应用边界扫描机制对电路系统进行测试的关键。在分析现有边界扫描测试生成算法的基础上 ,提出了一种极小权值 极大相异性算法。该算法可以在确定边界扫描测试向量集的紧凑性指标的前提下 ,生成故障诊断能力相当优化的测试向量集。仿真试验表明 ,该算法的性能优于现有的类似算法。

Boundary scan technique(BST) is a new and effective way of test and design for testability for VLSI circuits.In order to use BST more efficiently,it is needed to study optimal test generation algorithms to generate test vector set with better properties.There are two typical optimizing problem in test generation.The first one:fix completeness index,to generate a vector set with best compactness index.The second one:fix compactness index,to generate a vector set with best completeness index.It is developed in this paper a new algorithm called minimum weight & maximum difference algorithm to solve the second optimizing problem.Simulation experiments show that this algorithm can greatly reduce aliasing symptom and confounding symptom,and achieve better properties than existing algorithms.