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基于PVDF压电薄膜的超声波测厚技术探究 被引量:1

Research of the ultrasonic thickness measurement technology based on PVDF piezoelectric thin film
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摘要 开展了基于PVDF压电薄膜的超声波测厚技术研究,通过分析超声波是弹性机械波的一种,在同种均匀介质中,其传播声速一定,当从一种介质进入另一种介质时,在结构表面会发生反射作用。因此,我们可以认为超声波从被测试件的表面发出到接收到另一底面反射波信号的传播间隔时间与被测厚度值成正比关系,从而测量厚度的问题转化成测量超声波在试件中传播时间的问题。基于PVDF压电薄膜的超声波测厚技术将为快速便捷的测量厚度问题提供一种新的手段,并为将来测厚技术系统的开发奠定技术基础,具有工程应用价值。 The ultrasonic thickness measurement Technology based on PVDF piezoelectric thin film was studied. The ultrasonic is a kind of elastic mechanical wave, and in the same homogeneous medium, the Propagation velocity is constant. When the ultrasonic enters another medium from a medium, it will be reflected in the role of surface structure. Therefore, we can think ultrasonic from the surface is testing out to receive the other bottom reflection wave signal propagation time interval is proportional to the thickness of the value, so the problem is transformed to measure the ultrasonic propagation time. the ultrasonic thickness measurement Technology based on PVDF piezoelectric thin film will provide a new way which can measure thickness rapidly, and this technology would lay a solid technical the foundation for the system of thickness measurement.
作者 申晓月
出处 《电子测试》 2013年第10期26-27,25,共3页 Electronic Test
关键词 PVDF 压电薄膜 超声测厚 PVDF Piezoelectric thin film ultrasonic thickness
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