摘要
介绍了一种用于X射线安全检测的多通道电荷读出集成电路。该电路可提供32通道的探测器电荷-模拟电压转换,具有无死区时间、失调校准和低噪声特性。电路由电荷放大器增益控制、时序发生器、移位寄存器链、电荷放大器阵列、采样保持放大器和驱动器等组成。芯片采用华润上华0.6μm标准CMOS工艺实现,管芯尺寸为3.1mm×7.1mm,工作在3.3MHz,5V供电和3.5V参考电压下的功耗为45mW。测试结果表明,在25.5pF的电荷放大器增益电容和52pF的光电二极管结电容下,电路的输出噪声性能达到90μV(Vrms)。
Abstract： A multi-channel charge readout integrated circuit （IC） for X-ray security inspection was described, which was capable of providing 32 channels of charge-to-analog-voltage conversion. Consisting of charge amplifier gain controller, timing generator, shift register chain, charge amplifier array, sample/hold （S/H） amplifier and driver, the multi-channel charge readout IC featured zero dead-time, offset calibration and low noise. Fabricated in CSMC＇s 0. 6 t^m standard CMOS process, the circuit occupied a silicon area of 3. 1 mm× 7. 1 mm. Operating at 3.3 MHz, the chip consumed 45 mW of power from 5 V supply and 3. 5 V reference voltage. Test results showed that the circuit achieved an output noise of 90 μV （Vms） on 25. 5 pF of charge amplifier gain capacitance and 52 pF of photodiode terminal capacitance.
出处
《微电子学》
CAS
CSCD
北大核心
2013年第5期602-606,共5页
Microelectronics
基金
国家自然科学基金资助项目"低功耗集成多级放大器的设计研究"(60976028)
