摘要
通过研究嵌入式闪存结构和接口及其时序信息,结合电容式触摸屏的应用环境,同时考虑闪存测试的需求,设计并实现了一种嵌入式闪存专用控制电路。设计以I2 C(Inter-Integrated Circuit)总线作为与主机的接口,定义了一套操作指令,实现了主机对闪存的读写和擦除等基本操作,完成了RTL(Register Transfer Level)代码编写。基于Ncsim仿真软件对电路进行功能仿真,结果表明,电路工作状态转换正常,可以进入测试模式进行测试,主机与MCU(Micro Controller Unit)都可以正常读写和擦除闪存。
The structure of embedded flash system and its interface and timing information were studied, and a control circuit was designed and implemented with application environment of capacitive touch panel and the requirement of flash memory test taken into consideration. With a set of instructions, programming, writing and erasing operations of embedded flash memory could be executed by host through I^2C bus. RTL （Register Transfer Level） coding was completed in the design. Functional simulation was made with Ncsim. Results showed that the circuit could change work-state properly to perform test by entering test mode. Both host and MCU could read, write and erase the flash memory properly.
出处
《微电子学》
CAS
CSCD
北大核心
2013年第5期657-660,666,共5页
Microelectronics
基金
中央高校基本科研业务费专项资金资助(ZYGX2010J040)
