摘要
晶体管图示仪是一种对晶体管特性参数进行测量的仪器。传统的晶体管图示仪体积大、功能强,但价格高昂。文章针对传统晶体管图示仪体积大的特点,在LabVIEW环境下,使用NI-DAQ数据采集函数,结合NI数据采集卡,构建了简易的晶体管图示仪。
Transistor Tracer is a kind of transistor parameters measuring instruments. Traditional transistor tracer is bulky, powerful, but expensive. In this paper, against bulky feature of the traditional transistor tracer, a simple transistor tracer is built using NI-DAQ data acquisition functions, combined with NI data acquisition card in the environment of LabVIEW.
出处
《仪表技术》
2013年第11期32-34,共3页
Instrumentation Technology
基金
高等学校博士点专项科研基金联合资助类(20121402110017)