一种数字电子实验常用芯片检测指示仪的研究

A Detection Indicator of Chips in Common Use for Digital Electronic Experiment

随着电子技术的迅速发展,数字芯片的应用越来越广泛,特别是74系列逻辑芯片在学生实验中更是至关重要。实验中要保证实验的效果,必须要求所用的芯片逻辑功能完整,但如果对所用芯片的各个管脚进行逐一测试,就显得十分繁琐,而且在数字电路的维护和维修中也经常要对芯片的好坏进行检测。因此,针对上述需要设计了以AT89C52单片机为控制核心并针对74系列逻辑芯片将传统检测算法进行优化后的简单可行的芯片检测指示仪,可以很方便的检测出实验室常用芯片的工作状态,为实验提供了便利。

Along with electronic technology＇s rapidly development, the digital chip＇s application is getting more and more widespread, specially 74 series logic chips, in the student tests is very important, in the experiment must guarantee that experiment＇s effect, must request the chip logical function which uses to be complete, but if to uses the chip each base pin to carry on tests one by one, appears very tedious, moreover smelts in digital circuit＇s maintenance and the service must carry on the examination frequently to the chip quality. So, in view of the above need, we have designed and aims at 74 series logic chips take the AT89C52 monolithic integrated circuit after the control core carries on the traditional examination algorithm optimized the simple feasible chip examination indicating instrument, It can easily detect the status of the laboratory work of the chip used for the experiments have been facilitated.