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Rapid evaluation method for the normal lifetime of an infrared light-emitting diode

Rapid evaluation method for the normal lifetime of an infrared light-emitting diode
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摘要 ： Based on the Arrhenius model, a rapid evaluation method for an infrared diode＇s normal lifetime is proposed, and the theoretical model is constructed. Accelerated life testing of an infrared light-emitting diode （IRLED）, which takes less time than usual, is carried out under temperature and electric current stress. Using this method, the activation energy and the IRLED＇s normal lifetime are calculated and analyzed. Key words： Arrhenius model; acceleration lifetime test; IRLED; activation energy Based on the Arrhenius model, a rapid evaluation method for an infrared diode＇s normal lifetime is proposed, and the theoretical model is constructed. Accelerated life testing of an infrared light-emitting diode （IRLED）, which takes less time than usual, is carried out under temperature and electric current stress. Using this method, the activation energy and the IRLED＇s normal lifetime are calculated and analyzed. Key words： Arrhenius model; acceleration lifetime test; IRLED; activation energy
作者 郭小峰 谭满清 韦欣 焦健 郭文涛 孙宁宁
机构地区 Institute of Semiconductors
出处 《Journal of Semiconductors》 EI CAS CSCD 2013年第11期61-64,共4页 半导体学报（英文版）
关键词 Arrhenius model acceleration lifetime test IRLED activation energy Arrhenius model acceleration lifetime test IRLED activation energy
分类号 TN312.8 [电子电信—物理电子学]
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共引文献69

Journal of Semiconductors
2013年 第11期

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