X-射线荧光光谱背景和基体效应综合校正公式

Comprehensive Correction Formulas for Backgrounds and Matrix Effects in X-Ray Fluorescence Spectrometry

本文根据散射内标和公共背景法的有关理论,导出了两个X-射线荧光光谱分析校正方程,将背景、基体吸收和重叠干扰校正,以及校正曲线定量分析等多种运算合并进行,因而应用起来十分简便,两个方程在数学形式上与目前使用的X-射线光谱仪计算机程序中通用的数学模型相似,便于推广应用。

Two comprehensive correction equations for X-ray fluorescence spectrometry have been derived from the theories of scattering internal standard and common-background in this paper. The simple mathematical relations have been established between microelement concentration and raw intensities, or their ratios to the scattering intensity which may act as both internal standard and common-background, of analyte and overlapping lines. It is easy to use the formulas for analysis because the corrections of backgrounds, matrix absorptions and overlapping effects, and calibration curve analysis can be performed together, instcad of the calculations by several steps as prior methods did. Both equations are similar in mathematical forms to those being widely used in the computer programs of recent X-ray spectrometers, therefore, they can be applied in the most XRF laboratories.