X-射线荧光光谱法分析面粉、大米中的微量元素

X-Ray Fluorescence Determination of Microamount of Elements in Wheat and Rice Flour Samples

本方法是将消解后的面粉和大米样品溶液滴加于粘贴在聚酯薄膜上的薄纸片上,用薄纸片来控制样品面积及富集被测元素,用于X-射线荧光光谱分析。该方法只用被测元素的标准溶液计算回归方程的系数,无需大量的标样,针对不同的元素选择不同的扣除背景的方法和不同的回归方程,使结果更准确。通过测定样品中的K、Ca、Mn、Zn、Fe、Cu、As、Se等元素,并与美国NBS标样参考值比较,结果基本一致。

The digested solution of wheat or rice flour sample is added on the thin slice of paper sticked on polyester film. The thin slice of paper is used to control the area of the sample solution and to concentrate the amount of elements determined for XRFA. The standard solution of the elements is provided for the coefficient calculation of the regression equation. Different method of deducting backgrounds and regression equation are used to different elements, The determined results of K, Ca, Mn, Zn, Fe, Cu, As, Se are the same values as the reference results of NBS of the U.S.A.