普通 X-射线荧光光谱仪在化学态分析中的应用

Application Of Conventional X-Ray Fluorescence Spectrometer for Chemical State Analysis

本文测定了PW1404 X-射线荧光光谱仪谱分辨率,比较了普通和高分辨率双晶X-射线荧光光谱仪测定某些典型试样中Si、Al和Cu的化学位移值,并用标准样品验证普通谱仪定量测定铝配位数丰度的精度和准确度,将普通谱仪测得的Si-O键键性与红外、拉曼光谱结果作了比较。在此基础上论述了普通谱仪在化学态分析中应占有一定的地位。

The spectral resolution of a Philips PW1404 X-ray fluorescence(XRF)spectrometer was measured. The chemical shift values of Si, Al and Cu in some compounds using a Philips PW1404 and Rigaku high resolution 3070 XRF spectrometer were determined and compared with those of standard samples. The precision and accuracy of Al coordination number were quantitatively measured uging conventional spectrometer. The results of Si-O bonding obtained by conventional XRF spectrometer were compared with those obtained by Raman and infrared spectrometers. It indicated that the conventional X-ray spectrometer could be used for chemical state analysis, under a certain condition.