摘要
本文分析了荧光同步扫描光谱同普通荧光光谱之间的关系,从理论上导出了荧光强度和半峰宽公式,并用蒽的正已烷溶液对其进行了验证.
This paper discusses the relationship between synchronous-excitation fluorescene (SEF) and conventional fluorescence spectrometry. The formula for fluorescence intensity and half-peak width of SEF has been derived theoretically. The advantages of SEF are discussed and have been verified with anthracence in hexane.
出处
《分析仪器》
CAS
1991年第1期13-16,共4页
Analytical Instrumentation