钨酸锆薄膜样品高温衍射测试方法

Analysis and Measurement of Zirconium tungstate Thin Film by High Temperature X-ray Diffraction

基于不对称布拉格反射理论,以平行光掠入射方式配合普通X射线粉末衍射仪的高温样品台,研究了玻璃基钨酸锆薄膜样品的高温衍射测试方法,与聚焦光方式相比,减弱了玻璃基体的噪音影响,增加了衍射峰的强度,提高了谱图的可读性。XRD数据表明:钨酸锆薄膜样品的晶格常数随温度升高而变小,从25℃时的0.91791 nm逐步变小至600℃时的0.91243 nm。

Based on the unsymmetrical Bragg reflection theory, with parallel beam grazing incidence mode combinated high temperature attachment of ordinary XRD, test method of the thin film of glass basis zirconium tungstate by high temperature diffraction was researched, compared to focus method, it weakened the noise effecting of glass substrate, increased the intensity of the diffraction peaks, improved the readability of the XRD pattern. Data of XRD showed that the lattice constants become smaller from 0.91791 nm to 0.91243 nm when the temperature arise from 25℃ to 600℃.