石墨烯的表征方法

Review of characterization methods of graphene

单层石墨烯的厚度为0.335nm,在垂直方向上有约1nm的起伏,且不同工艺制备的石墨烯层数和结构有所不同,如何有效地鉴定石墨烯的层数和结构是获得高质量石墨烯的关键步骤之一。介绍了光学显微镜、扫描电子显微镜(SEM)、透射电子显微镜(TEM)、原子力显微镜(AFM)、拉曼光谱(Raman)、红外光谱(IR)、X射线光电子能谱(XPS)和紫外-可见光谱(UV-Vis)等几种用来表征石墨烯的主要方法。

The thickness of the single layer graphene was 0. 335nm, with the fluctuation of lnm in vertical direc- tion. The layer and structure of graphene depend on the preparation process, to prepare high quality graphene, one of the key steps was how to confirm the layer number and structure of graphene effectively. This paper in- troduced several main methods used to characterize graphene including the optical microscope, scanning electron microscope （SEM）, transmission electron microscope （TEM）, atomic force microscope （AFM）, Raman spec- trum （Raman）, infrared spectrum （IR）, X-ray photoelectron spectroscopy （XPS） and ultraviolet-visible spectra （UV-Vis）.