期刊文献+

纳米Ni颗粒增强无铅Sn-Cu-Ag复合钎料搅拌辅助低温钎焊技术 被引量:10

Low-temperature soldering technology with stirring for nano-Ni particle-reinforced lead-free Sn-Cu-Ag composite solders
下载PDF
导出
摘要 采用搅拌辅助低温(半固态区间)钎焊技术,制备低银无铅钎料和纳米复合钎料钎焊接头。结果表明:240℃时复合钎料的润湿时间较基体的润湿时间缩短了31%,润湿力较基体的提高了3.8%;机械搅拌在破碎树枝晶和加速元素扩散的同时,降低了液相的温度梯度和成分过冷,大大削弱了钎料基体中金属间化合物(IMC)Cu6Sn5的枝晶生长,促使针状Cu6Sn5破碎呈短棒状;在低银无铅钎料中加入纳米Ni颗粒,Ni与Cu6Sn5生成孔洞状化合物(Cux Ni1-x)6Sn5及低温搅拌形成的气孔成为界面原子的扩散通道。搅拌形成的紊流和热流传递加快了原子的溶解与扩散,加速了界面IMC的生长。 The soldering joints of low silver solder and nano-particle lead-free Sn-Cu-Ag composite solder were prepared by the technology of low-temperature soldering (at semi-solid state) with stirring, respectively. The results show that the wetting time of nano-particle composite solder is decreased by 31% at 240 ℃, and the wetting power is increased by 3.8% compared those of with the matrix. Mechanical mixing can break dendrites and accelerate the diffusion of elements, and also reduce the temperature gradient and the composition undercooling of the liquid, thus, greatly weaken the growth of IMC-Cu6Sn5 dendrite in solder matrix and making needle-shaped intermetallic compound (IMC) Cu6Sn5 break into short rod-like. After adding nano-Ni particles into the low silver solder, cavitary compounds of (CuxNil-x) 6 Sn5 generated by Ni with Cu6Sn5 and the porosities formed by stirring at low temperature are as the diffusion path of interface atoms. The turbulent flow and heat flow due to stirring accelerate the dissolution and diffusion of the atom, and speed up the growth of IMC.
出处 《中国有色金属学报》 EI CAS CSCD 北大核心 2013年第10期2875-2881,共7页 The Chinese Journal of Nonferrous Metals
基金 国家自然科学基金资助项目(50975303) 重庆理工大学科研启动基金资助项目(2012ZD12) 重庆市教委科技研究一般项目(KJ130813) 重庆高校优秀成果转化资助重大项目(KJZH11215)
关键词 纳米Ni增强Sn-Cu-Ag复合钎料 低温钎焊 搅拌 润湿性 金属问化合物 nano-Ni particle Sn-Cu-Ag composite solders low-temperature soldering stirring wettability intermetalliccompound
  • 相关文献

参考文献5

二级参考文献53

  • 1李晓延,严永长.电子封装焊点可靠性及寿命预测方法[J].机械强度,2005,27(4):470-479. 被引量:43
  • 2程光辉,张柯柯,余阳春,杨洁,樊艳丽,王双其.SnAgCu系钎料合金对表面贴装元件润湿特性研究[J].电子工艺技术,2006,27(1):37-40. 被引量:7
  • 3梁凯,姚高尚,简虎,熊腊森.微电子封装无铅钎焊的可靠性研究[J].电子质量,2006(4):28-31. 被引量:2
  • 4卢斌,王娟辉,栗慧,朱华伟,焦宪贺.添加0.10%Ce对Sn-0.7Cu-0.5Ni焊料与Cu基板间界面IMC的影响[J].中国有色金属学报,2007,17(3):390-395. 被引量:22
  • 5[1]Gaudul H E, Chin J. Low temperature lead free soldering for complex PCBs [J]. Electron Packg Prod, 1992, 37-45.
  • 6[2]Tomlinson W J, Fullylove A. Strength of tin based solder joints [J]. Mater Sci, 1992, 27: 577-585.
  • 7[4]Daniel Lewis, Sarah Allen, Michael Notis, et al. Determination of the eutectic structure in the Ag-Cu-Sn system [J]. Electron Mater, 2002, 31(2): 161-167.
  • 8[5]Moon K W, Boettinger W J, Kattner U R, et al. Experiment and thermodynamic assessment of Sn-Ag-Cu solder alloys [J]. Electron Mater, 2000, 29(10): 1122-1136.
  • 9[8]Kang S K, Choi W K, Yim M J, et al. Studies of the mechanical and electrical properties of lead-free solder joints [J]. Electron Mater, 2002, 31(11): 1292-1303.
  • 10Moon K, Boettinger W, Kattner U et al. Experimental and thermodynamic assessment of Sn - Ag - Cu solder alloys [ J ]. Journal of electronic materials, 2000,29 ( 10 ) : 1122 - 1136.

共引文献81

同被引文献95

引证文献10

二级引证文献36

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部