一种由压电双晶片测量压电材料参数的动态方法

The Model and Method of Dynamic Measurement for Piezoelectric Parameters and the Dependence of Temperature of Piezoelectric Bimorphs

本文根据悬臂梁式压电双晶片的动态导纳矩阵 ,提出一种压电材料参数动态测试模型 ,用于测量压电双晶片的几个主要材料参数 :压电应变常数d31、机电耦合系数k31、介电常数εT33、弹性柔顺系数SE11及材料参数的温度特性。本文的这种测量方法不同于通常的由标准试样测量压电材料参数的方法 ,是直接由一种实用元件—压电双晶片 (非标准试样 )测量压电材料的参数。文中详细描述了测试原理、测试步骤及一种实际试样的测试结果。理论与实验结果表明 :这种新的测试方法是可行的。

In this paper,the dynamic measuring model and method of piezoelectric parameters of piezoelectric bimorphs have been constituted based on the dynamic admittance matrix of piezoelectric cantilever bimorphs.By this method,many parameters,for example,the piezoelectric constant d 31 ,the electromechanical coupling constant k 31 ,the dielectric constant ε T 33 ,the elastic compliance constant S E 11 ,and their dependence on temperature,can be gained.By contrast with common methods which measure piezomaterial parameters using standard samples,as we normally use,this new method use a practical sample piezoelectric bimorphs.The measuring principle,measuring apparatus,and the experimental values of a typical example of piezoceramic bimorphs are described in detail in this paper.The principle and the results gained by experiment validate the availability of this method.