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STM investigations of local potential barrier distribution of the atomic surface of graphite 被引量:1

STM investigations of local potential barrier distribution of the atomic surface of graphite
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摘要 To modulate the tunneling gap with the lock in amplifier in the scanning tunneling microscopy(STM), information of the tunneling current variation can be obtained. The local potential barrier distribution of graphite surface atoms is got by means of such technology. Compared with STM image under topography observation mode, the local potential barrier image has higher resolution and less influence on the tip and better anti interference capability. Observed results of the graphite are given and discussed in this paper. To modulate the tunneling gap with the lock in amplifier in the scanning tunneling microscopy(STM), information of the tunneling current variation can be obtained. The local potential barrier distribution of graphite surface atoms is got by means of such technology. Compared with STM image under topography observation mode, the local potential barrier image has higher resolution and less influence on the tip and better anti interference capability. Observed results of the graphite are given and discussed in this paper.
出处 《原子与分子物理学报》 CAS CSCD 北大核心 2000年第4期603-607,共5页 Journal of Atomic and Molecular Physics
关键词 STM 局部势垒分布 石墨原子表面 Scanning tunneling microscopy(STM) Local potential barrier Lock in amplifier
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参考文献3

  • 1Song J P,Surf Sci,1993年,296卷,299页
  • 2Bai L C,Scanning tunneling microscopy and applications(In Chinese),1991年,35页
  • 3Lu H J,Surface analysis technology(In Chinese),1987年,120页

同被引文献19

  • 1Binnig G,Rohrer H.Scanning tunneling microscopy[J].Helv.Phys.Acta,1982,55:726.
  • 2Huang D H,Aono M.Scanning tunneling microscopy fabrication of an Si atom chain[J].Surf.Sci.,1997,386(1-3):166.
  • 3Tomitori M,Terai H,Arai T.Energy spectrum of backscattered electrons excited by a field emission scanning tunneling microscope with a build-up[111]-oriented W tip[J].Appl Surf.Sci.,1999,145:123.
  • 4Tomitori M,Hirade M,Suganuma Y,et al.An applicability of scanning tunneling microscopy for surface electron spectroscopy[J].Surf.Sci.,2001,493(1-3):49.
  • 5Hirade M,Arai T,Tomitori M.Detection improvement for electron energy spectra for surface analysis using a field emission scanning tunneling microscope[J].Jpn.J.Appl.Phys.Part 1,2003,42(7B):4837.
  • 6Hirade M,Arai T,Tomitori M.Energy spectra of electrons backscattered from sample surfaces with heterostructures using field-emission scanning tunneling microscopy[J].Jpn.J.Appl.Phys.Part 1,2006,45(3B):2278.
  • 7Miyatake Y,Nagamura T,Hattori K,et al.Development of electron source for Auger electron spectroscopy in scanning probe microscope systems[J].Jpn.J.Appl.Phys.Part 1,2002,41(7B):4943.
  • 8Miyatake Y,Nagamura T,Hattori K,et al.Development of scanning probe microscope for Auger analysis[J].Jpn.J.Appl.Phys.Part 1,2003,42(7B):4848.
  • 9Eves B J,Festy F,Svensson K,et al.Scanning probe energy loss spectroscopy:angular resolved measurements on silicon and graphite surfaces[J].Appl.Phys.Lett.,2000,77(25):4223.
  • 10Palmer R E,Eves B J,Festy F.Scanning probe energy loss spectroscopy[J].Surf.Sci.,2002,502:208.

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