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COIL用高反膜总积分散射的测量方案探讨

A Study on the Measurement Concept for the Total Integration Scattering of COIL High Reflection Film
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摘要 根据 COIL用反射镜的工作条件 ,提出了用改进的 Coblentz半球测量 0°和 4 5°入射情况下 TIS散射的方案。 A concept for measuring the total integration scattering of COIL high reflection film in 0° and 45° incident cases with an modified Coblentz hemisphere is proposed according to the operating conditions of COIL high reflection film.The measured results are compared with the other measuring methods.
出处 《光电工程》 CAS CSCD 1999年第6期41-44,共4页 Opto-Electronic Engineering
关键词 高反射膜 总积分散射 光损耗 High reflective films,Total integrated scatter,Light losses.
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