对并行测试生成理论的一点综述

A Summary on the Theory of ATPG

综述了并行自动测试生成 (ATPG)理论的发展概况 ,并对发展前景提出了几点看法。文章特别强调 :研究一种能把被测电路实质性划小的方法是进一步提高并行 ATPG效率的关键所在。

This paper sumarized the development of the theory of ATPG and put forward some ideas about the prospect of it development.It is especially emphasized in this paper hat the key to the further improvement of the efficiency of ATPG lies in the researching and realizing a method to decompose the tested circuit substantially.