摘要
简要介绍了北美体系(IES)和国际电工协会(IEC)体系中LED光源流明维持寿命评估标准的发展和现状。基于半导体产品可靠性相关知识,对美国照明工程学会2011年发布的IES TM-21-11 LED光源流明维持寿命的推算方法中的数据选用和数据处理方法提出了质疑,并通过文中提及的E3.0实例对问题观点进行了例证说明。建议选用设备可靠性试验的相关标准GB5080-85对LED光源流明维持寿命进行评估,期望能够给国内半导体照明行业相关人士提供参考。
The development of LED light source lumen maintenance life evaluation standard was briefly introduced which is belonged to illuminating engineering society （IES） of the United States of America and international electrotechnical commission （IEC）. Based on the reliability knowledge of semiconductor, a few viewpoints of IES TM-21-11 about projecting long term lumen maintenance of LED light source were oppugned which were issued by IES in 2011, and the viewpoints were expounded through E3.0 about data process of LED light source＇ s lumen maintenance life. A standard named GB5080-85 about equipment reliability test is suggested, which is hoped to provide some reference to the people of domestic semiconductor lighting trade.
出处
《半导体技术》
CAS
CSCD
北大核心
2013年第12期946-948,共3页
Semiconductor Technology
关键词
ED光源
流明维持寿命
流明退化率
阿列尼斯方程
最小二乘曲线拟合
点估计
区间估计
LED light source
lumen maintenance life
lumen decay rate
Acheniums equation
the least squares curve-fit
point estimation
interval estimation
