新型CZT半导体X射线和g射线探测器研制与应用展望

The development of CZT semiconductor X-ray and g-ray detectors

CdZnTe(CZT)半导体是一种性能优异的室温X射线和γ射线探测材料,在环境监测、医学诊断、工业无损检测、安全检查、空间科学等众多领域有广泛的应用前景。文章简要介绍了CZT探测器的基本工作原理和性能评价指标,阐述了CZT晶体物理性能对CZT探测器性能的影响规律和CZT探测器的模拟与设计方法。CZT半导体探测器的应用与发展前景广阔,为此需要重点开展高质量、低成本的CZT晶体生长研究,CZT探测器的设计与制备以及辐射探测整机系统的设计与开发。

CdZnTe is an excellent candidate for high efficiency, high-resolution room-tem- perature nuclear radiation detectors, which are being widely used in environmental monitoring, medi- cine, industrial non-destructive testing, security inspection and space science. The working principle and performance evaluation of CZT detector were first described briefly. And then the relationship be- tween the CZT crystal physical properties and the CZT detector performance was discussed. The CZT detector simulation and design methods were presented. For promotion of the application and develop- ment of the CZT detector, the studies on high-quality, low-cost CZT crystal growth technology, CZT detector design and fabrication and the radiation detection system should be enhanced.