摘要
从研究半导体PN结器件烧毁物理机理出发,建立了一种高效通用的半导体PN结器件计算机分析模型,并编制了一维德态程序,瞬态程序及二维模型研究将随后开展。
Based on the purpose of mechanism research of burnout of semiconductor PN devices,we built a general and high per formance computer mode for it,and programmed the one -dimensional static code. The transit and the two dimensional situation will be fol-lowed.
出处
《衡阳师范学院学报》
1999年第6期34-39,共6页
Journal of Hengyang Normal University