摘要
建立了微波等离子体原子发射光谱法直接测定金属铜中微量硅的分析方法.在低温加热下用硝酸溶解试样,选择Si 251.611 nm的光谱线作为分析线,在选定的称样量情况下,基体铜对测定无干扰.对A级铜样品测定的相对标准偏差在10％左右,加标回收率在94％ ～ 105％.本法测定结果与国标法（硅钼蓝分光光度法）分析方法测定结果一致.该方法适用于金属铜中微量硅的分析测定.
A method for determination of silicon in copper metal by Microwave Plasma Atomic Emission Spec- troscopy （MP-AES） was established in this article. The sample was dissolved with nitric acid by heating at low temperature. The spectral line of Si 251. 611 nm was selected as analytical line. The matrix of copper did not effect on the determination of silicon by selecting method. The relative standard deviation of silicon in the sample of A- class copper is about 10% , standard additior, recovery is between 94% and 105%. The determination results are consistent with determination results by national standards method. The established method is suitable for determi- nation of silicon in copper metal.
出处
《矿冶》
CAS
2013年第4期121-123,共3页
Mining And Metallurgy
