摘要
理论研究发现,在薄型半导体探测器前添加一定厚度的杂散电子过滤片,可以有效过滤探测系统中散射电子,准确测定探测器对γ射线诱发电子的电荷收集效率。以电荷收集效率为100%的Si-PIN探测器作为该测量方法理论模拟和实验校验的基准,建立了化学气相沉积(chemical vapor deposition,CVD)金刚石薄膜探测器对γ射线响应时电荷收集效率的测量方法和系统。研究结果表明:所研制的CVD金刚石薄膜探测器,在600V饱和偏压下,电荷收集效率在常态时为55%,在"priming"状态时可达69%。
A novel method is proposed for measurement of the charge collection efficiency of a chemical vapor deposition （CVD） diamond detector in γ-ray detection. A slab is laid before the detector to absorb the scattering electrons in the detector so that the interference of those scattering electrons can be effectively removed. The method is validated by the experiment with a Si-PIN detector, which has a charge collection efficiency of about 100%. The results of both experiments are compared with those of the theoretical calculation by MCNP, indica- ting that the charge collection efficiency of the detector for γ-rays at 600 V biased voltage is 55% at normal state, and 69% at priming state.
出处
《现代应用物理》
2013年第4期307-312,共6页
Modern Applied Physics
基金
国家自然科学基金资助项目(No.10675074
No.11275153
No.11175142)
关键词
金刚石薄膜
半导体探测器
电荷收集效率
辐射测量
化学气相沉积
diamond film
semiconductor detector
charge collection efficiency
radiation measurement
chemical vapor deposition
