摘要
测压铜柱在高低温环境下使用时会带来较大的测压误差，必须进行高低温校准。针对当前测压铜柱高低温静态校准系统中的高低温加载部分使用不便的问题，提出了基于半导体制冷技术对其进行改进。对高低温箱的结构及温度测控系统进行了设计及研制，并进行了温度控制实验，高低温箱可控制在-40-50℃范围内，温度控制精度优于±0．5℃，满足了测压铜柱高低温静态校准的要求。
A larger pressure measurement error is caused when copper cylinder used in high-low circumstance temperature, so temperature calibration is necessary. Since the inconvenience in copper cylinder high-low tem- perature calibration system, a method is proposed based on semiconductor refrigeration technology to solve the problem. The structure and control system of a local temperature box are designed. Experiments show that tem- perature in the box can be controlled within -40- 50 ℃. temperature controlling effect has an accuracy of ± 0. 5 ℃, and the requirements of static temperature caliibration are satisfied for copper cylinder.
出处
《测控技术》
CSCD
北大核心
2014年第1期153-156,共4页
Measurement & Control Technology
关键词
测压铜柱
校准
半导体制冷
温度控制
pressure-measuring copper cylinder
calibration
semiconductor refrigeration
temperature control
