摘要
低温光谱是红外滤光片一项重要的考核参数,采用傅里叶光谱仪测试了红外滤光片在安装滤光片架前后的常温和85K低温光谱,同时利用有限元分析方法模拟了85K的红外滤光片安装滤光片支架前后的形变和应力,分析和比较了试验结果,为进一步优化红外滤光片的可靠性设计提供了参考。
The spectrum feature is the main evaluation indicator of infrared filter working at cryogenic temperature, The Fourier transform infrared （FT-IR） spectrometer is used to measure infrared filter＇s spectrum be{ore and after assembling the shelf of infrared filter, while we adopt the finite element analysis method to simulate the stress and deformation of infra- red filter at 85K temperature. At last, we analyze and compare the experimental results for the optimization of design of in- frared filter＇s reliability.
出处
《光学与光电技术》
2013年第6期29-32,共4页
Optics & Optoelectronic Technology
关键词
红外滤光片
低温光谱
短波漂移
热应力
背景辐射
infrared filter
low temperature spectrum
short-wave moving
thermal stress
background radiation
