期刊文献+

自校准技术在多通道测试设备中的应用 被引量:2

Application of Self-calibration Technology on Multi-channel Test Devices
下载PDF
导出
摘要 着眼于解决多通道设备的校准问题。多通道设备的校准通过在设备设计之初内装自校准模块来实现,并使用外接设备来校准自校准模块中的基准源。输出参量采用内部自校准模块自动校准,可以大大减少设备的校准工作量。 This paper focused on solving problems in calibration of multi-channel devices. Calibration of muhi-channel devices was actualized by installing self-calibration module in the devices during the early design period, and the benchmark source in the self-calibration module was calibrated by means of external devices. Output parameters can be calibrated automatically with internal self-calibration module, which will save much time and labor in device calibration.
出处 《计测技术》 2013年第6期59-61,共3页 Metrology & Measurement Technology
关键词 自校准 多通道 自动测试 self-calibration multi-channel automatic test
  • 相关文献

参考文献5

二级参考文献19

  • 1许艳.最佳电压基准源的设计[J].大庆师范学院学报,2006,26(5):61-64. 被引量:1
  • 2洪文学 周少敏.虚拟仪器的概念、结构与实现[J].VXI世界,1996,2:30-32.
  • 3马怀俭.VXI总线讲座专题资料[J].电测与仪表,1991,(1).
  • 4Ph.Thissen,Verleysen M,Legat J D.Matching properties of CMOS SO1 transistors[Z].1994:184-187.
  • 5MARCEL J.M.PELGROM,MEMBEIRE,E EA,AD C.J.DUINMAIJER,AND ANTON P.G.WELBERS.Matching Properties of MOS Transistors[J].IEEE JOURNAL OF SOLID-STATE CIRCUITS,OCTOBER 1989,24(5):1433-1440.
  • 6Balestrieri E.Some Critical Notes on DAC Time Domain Specifications[C].IMTC 2006-Instrumentation and Measurement Technology Conference,930-935.
  • 7Janusz A.Starzyk,Russell P.Mohn.Cost-Oriented Design of a 14-bit Current Steering DAC Macrocell[C].IEEE International Symposium on Circuits and Systems,May 25-28th,2003.
  • 8Yan S,Sanchez-Sinencio E.A continuous-time sigma-delta modulator with 88-dB dynamic range and 1.1-MHz signal bandwidth[J].Solid-State Circuits,IEEE Journal,Jan.2004,39(1):75-86.
  • 9阮奇桢.我和LabView[M].北京:北京航空航天大学出版社,2009:1-3.
  • 10JJF1057-1998数字存储示波器校准规范.北京:国家质量技术监督局发布.

共引文献14

同被引文献26

引证文献2

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部