基于成败型元件试验数据和系统试验数据的串联系统可靠性的置信下限

THE LOWER CONFIDENCE BOUND FOR SERIES SYSTEM RELIABILITY BASED ON BOTH PASS-FAIL COMPONENTS AND SYSTEM TEST

本文根据成败型元件和系统两者的试验数据来估计串联系统可靠性的置信下限。首先根据元件和系统两者的试验数据,求出系统可靠性的极大似然估计,然后按L-M(Lindstrom-Madden)法给出系统可靠性置信下限的近似值,并提供了数字例子。

In this paper, we estimate the lower confidence bound for series system reliability based onboth pass-fail components and system test data. At first, the maximum likelihood estimate for thesystem reliability is evaluated based on the both data above mentioned. Then, according to the L-M(Lindstrom-Madden) method, the approximate value of the lower confidence bound of systemreliability is given. Numerical example is presented.