SRAM型FPGA单粒子辐照试验系统技术研究

Study of SEU radiation experimental system technology of SRAM-based FPGA

单粒子辐射效应严重制约FPGA的空间应用,为提高FPGA在辐射环境中的可靠性,深入研究抗辐射加固FPGA单粒子效应评估方法,设计优化单粒子效应评估方案,开发相应的评估系统,提出基于SRAM时序修正的码流存储比较技术和基于SelectMAP端口配置回读技术。借助国内高能量大注量率的辐照试验环境,完成FPGA单粒子翻转(SEU)、单粒子闩锁(SEL)和单粒子功能中断(SEFI)等单粒子效应的检测,试验结果表明,该方法可以科学有效地对SRAM型FPGA抗单粒子辐射性能进行评估。

The space application of FPGA（Field Programmable Gate Array） is restricted by the single event effects caused by radiation. In order to improve the reliability of the FPGA in the radiation environment , the method of single event effect assessment for hardened FPGA is studied. The single event effect assessment program is optimized and two methods are introduced, one is SRAM clock-correcting based bitstream storage comparison method and the other is con-figuration readback method based on SelectMAP port. Some experiments about Single Event Upset（SEU）, Single Event Latch（SEL）and Single Event Function Interrupt（SEFI）are done with the help of high-energy radiation experiment envi-ronment. The results show that the assessment program introduced is scientific and effective for SRAM based FPGA radia-tion assessment.