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A growth kinetics model of rate decomposition for Si_(1-x)Ge_x alloy based on dimer theory 被引量:1

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摘要 According to the dimer theory on semiconductor surface and chemical vapor deposition(CVD) growth characteristics of Sil_xGex, two mechanisms of rate decomposition and discrete flow density are proposed. Based on these two mech- anisms, the Grove theory and Fick's first law, a CVD growth kinetics model of Sil-xGex alloy is established. In order to make the model more accurate, two growth control mechanisms of vapor transport and surface reaction are taken into account. The paper also considers the influence of the dimer structure on the growth rate. The results show that the model calcuated valne is consistent with the experimental vahles at different ternnerntllres. According to the dimer theory on semiconductor surface and chemical vapor deposition(CVD) growth characteristics of Si1-xGex, two mechanisms of rate decomposition and discrete flow density are proposed. Based on these two mechanisms, the Grove theory and Fick's first law, a CVD growth kinetics model of Si1-xGex alloy is established. In order to make the model more accurate, two growth control mechanisms of vapor transport and surface reaction are taken into account. The paper also considers the influence of the dimer structure on the growth rate. The results show that the model calculated value is consistent with the experimental values at different temperatures.
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第1期284-288,共5页 中国物理B(英文版)
基金 Project supported by the State Key Development Program for Basic Research of China (Grant No. 6139801-1).
分类号 O [理学]
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