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半导体激光器噪声的测量 被引量:5

Noise measuring methods of semiconductor lasers
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摘要 概述了半导体激光器噪声测试领域的几种先进技术方法,包括直接测量、互谱测量、多通道测量、数字测量及干涉测量。介绍了各种方法的原理和特点。 Some advanced methods on noise measurement are presented, including some direct measuring, such aS cross-spectrum measuring, multi-channel measuring, digital measuring, interference measuring. The principles and characters of all the measuring methods are introduced.
出处 《半导体技术》 CAS CSCD 北大核心 2001年第1期53-56,共4页 Semiconductor Technology
基金 华为基金!(99018103)
关键词 半导体激光器 噪声 测量方法 semiconductor laser noise measuring methop
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  • 1安妮,固体电子学研究与进展,1989年,9卷,3期,272页
  • 2王宏禹,随机数字信号处理,1988年
  • 3陈佳圭,微弱信号检测,1987年

共引文献9

同被引文献31

  • 1肖昱,杜磊,庄奕琪,李伟华.1/f噪声功率谱的加权最小二乘法拟合[J].电子质量,2004(12):4-5. 被引量:2
  • 2包军林,庄奕琪,杜磊,李伟华,马仲发,万长兴.基于小波分析和虚拟仪器技术的1/f噪声研究[J].电子器件,2006,29(2):369-372. 被引量:6
  • 3刘海涛,陈建平,陈向飞,姜典杰,黄俊斌.低掺杂铒纤上分布反馈布拉格光纤激光器的制作[J].中国激光,2006,33(7):873-876. 被引量:15
  • 4G Bendelli, K Komiri and Shigehisa Arai. Gain Saturation and Propagation Characteristics of Index-guided Tapered-waveguide Traveling-wave Semiconductor laser Amplifiers (TTW.SLA's). IEEE Journal Quantum Electronics. 1992, 28 (2): 447- 458.
  • 5Yih-Jun Wong, Chih-Wei Hsu, and C. C. Yang. Characteristics of a Dual-Wavelength Semiconductor Laser Near 1550 nm. IEEE Photonics Technology Letters. 1999, 11(2):173-175.
  • 6CaiJianxin. Output Characteristics of Semiconductor Laser. Project of NEE: 635.
  • 7Yisong Dai,Jiesung Shi,Xinfa Zhang.A Study Optical Noise Measurement as a Reliability Estimation for Laser Diodes,Microelectronics Reliability,1995,35:731-734.
  • 8Gisela Hartler,Ute Golze,Katrin Paschke.Extended NoiseAnalysis-a Novel Tool for Reliability Screening.Microelectronics Reliability,1998,38:1193-1198.
  • 9邓炎,王磊.LabView 7.1测试技术与仪器应用.机械工业出版社.
  • 10Wornell G W.Wavelet-based representations for the 1/f family of fractal processes[].Proceedings of Tricomm.1993

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