摘要
通过对某制导弹药电子延时器进行失效模式分析及仿真模拟,探寻可能出现的长贮失效模式与原因。以自然贮存9年的电子延时器为样本,制订了步进温度应力加速退化试验方案,开展试验并对试验结果进行分析,得出可能导致产品退化的各种原因。
A failure mode and effect analysis and simulation are carried out to find out the probable failure mode and causes which is then proved by step-stress accelerated degradation test with electronic delayer samples of real-world -storage for 9 years. The probable causes of degradation are presented by analyzing the test result.
出处
《电子产品可靠性与环境试验》
2014年第1期41-45,共5页
Electronic Product Reliability and Environmental Testing
关键词
电子延时器
长贮
加速退化
制导弹药
electronic delayer
long-term-storage
accelerated degradation
guided munition
