摘要
给出了一种产品的长记忆寿命模型 ,推导出产品寿命的威布尔分布特性 ,对产品寿命试验的设计、分析。
We present a model of long range dependent product life and deduce the characteristics of Weibull life distributions. The results are helpful for the design, analysis and simulation of product life testing.
出处
《电子产品可靠性与环境试验》
2001年第1期7-9,共3页
Electronic Product Reliability and Environmental Testing
