摘要
介绍了GaAs器件及MMIC的可靠性研究现状 。
This paper introduces the development of reliability researches on GaAs devices and MMICs. Failure modes and failure mechanisms of some GaAs devices are presented.
出处
《电子产品可靠性与环境试验》
2001年第1期29-33,共5页
Electronic Product Reliability and Environmental Testing