X射线残余应力的层析扫描测定

X-Ray Computer Tomography on Residual Stress Measurement

针对常规X射线残余应力测定法和美国X2 0 0 1应力仪测定方法存在的问题 ,提出了测定低原子序数材料内部三维应力的层析扫描方法 ,对装置和测定原理进行了讨论 ,设计出适合于层析扫描测定方法的计算机程序。根据提供的试验数据 ,能够对这类材料表面及内部任意一点进行全三维应力分析 ,计算应力及梯度和被测材料的晶面间距 ,并有一套计算的自我控制机制。

X ray computer tomography for the measurement of triaxial stresses within a low atomic order material is presented to aim at the shortcoming of conventional X ray stress analysis and AST2001 X ray stress analyzer of USA. The device for X ray computer tomography of residual stresses and the measurement theory is discussed. The computer procedure for the measurement of X ray computer tomography is designed. With the diffraction data provided, complete triaxial stresses of an arbitrary point on the surface of and within material investigated can be evaluated. The stress tensors, stress gradients and stress free lattice spacing of material investigated can also be calculated. And a self control mechanism for measurement and evaluation is presented.