电离总剂量复合屏蔽模拟仿真及验证试验

Simulation and Validation of Composite Shielding for Total Ionizing Dose

空间环境中辐射粒子的电离总剂量效应对卫星电子器件危害严重,需要采用合适的材料进行屏蔽防护.本文采用蒙特卡罗方法模拟材料对电子的屏蔽,将双层复合屏蔽方法与单质屏蔽方法进行对比,结果表明对电子而言,复合屏蔽在屏蔽厚度足够大时比单质屏蔽效果更好.利用^(90)Sr-^(90)Y电子放射源进行了复合屏蔽效果的验证试验,试验结果与模拟结果规律相符,研究结果可为辐射防护的优化设计提供参考.

Total ionizing dose effects caused by space radiation environment will be hazards for satellite electronic devices, and radiation shielding with appropriate materials is needed. Different shielding schemes for electron have been simulated with Monte-Carlo method. Three different shield- ing options, i.e., pure aluminum, pure tantalum and double-layer structure constituted by these two materials, have been compared. The results indicated that, when the shielding thickness is large enough, composite shielding for electron is better than single material shielding. And through exper- iments using the 90Sr-90Y source for irradiation test, pure material shielding and composite shielding are compared. The results were consistent with those of the simulation. The research conclusions can provide valuable references to optimization design for radiation shielding.