期刊文献+

专利计量视角下的我国纳米技术发展现状及趋势分析 被引量:4

Chinese Nanotechnology Development Status and Trend Analysis Based on Patents Information Analysis
下载PDF
导出
摘要 为了解我国纳米技术发展现状,采用专利计量方法,对纳米技术专利申请的时间分布、技术领域分布、申请人分布、技术发展态势以及发展趋势进行分析。认为,我国纳米技术围绕着碳的制备等领域在快速发展的同时正在进行新一轮技术的储备;纳米技术目前主要处于科研阶段,高校与企业合作以促进成果转化问题应引起足够的重视;多数申请人还不具备较为全面的技术,需加强各具有不同技术和资源优势的申请人之间的合作,以提高我国纳米技术的整体全面提升。 For exploring nanotechnology development status, the paper analyzes time, technology area and applicants distributions, and technology development status and development trend by applying patent metrology. The results show: ( 1 ) The patents application sum is increasing and technology is experiencing gestation period of adjustment. (2) C01B31/02 and some other technology areas are hot areas. Zhejiang university and some other universities are major application institutions. (3) C01B31/02 and other twelve areas will continue to increase. A61K35/78 and other five areas will decline. D01D5/00 and other three areas are seriously affected by external factors. Accordingly, the paper concludes that nanotechnology focusing on C01 B31/02 shows rapid development trend. Universities and companies should form comprehensive cooperation. And different applicants with different strength should cooperate to promote nanotechnology comprehensively.
作者 费琳
机构地区 江苏大学图书馆
出处 《科技管理研究》 CSSCI 北大核心 2014年第5期105-109,共5页 Science and Technology Management Research
关键词 专利计量 纳米技术 时间分布 技术领域分布 申请人分布 发展态势 发展趋势 patents information nanotechnology time distribution technology area distribution applicants distribution development status development trend
  • 相关文献

参考文献6

二级参考文献35

  • 1梁立明,谢彩霞,刘则渊.我国纳米科技研究力量的机构分布与地域分布[J].自然辩证法研究,2004,20(9):67-72. 被引量:18
  • 2唐炜,刘细文.纳米科技领域授权发明专利国际比较[J].高科技与产业化,2005,11(5):44-47. 被引量:4
  • 3王海威,朱建忠,许庆瑞.技术创新能力及其测度指标研究综述[J].中国地质大学学报(社会科学版),2005,5(5):26-30. 被引量:32
  • 4唐炜,刘细文.专利分析法及其在企业竞争对手分析中的应用[J].现代情报,2005,25(9):179-183. 被引量:73
  • 5http://info.lamp.hc360.com/2009/02/18064449178.shtml. 2009-03-12.
  • 6OECD. Nanotechnology: an overview based on indica- tors and statistics[ EB/OL]. OECD Science, Technolo- gy and Industry Working Papers, 2009/07, Directorate for Science, Technology and Industry, http://www. oecd. org/dataoecd/59/9/43179651, pdf.
  • 7Richard P. Appelbaum, Rachel Parker and Cong Cao. Developmental state and innovation: nanotechnology in China[J~. Global Networks 2011, 11(3):298 - 314.
  • 8Hullmann A. Measuring and assessing the development of nanotechnology [ J ]. Scientometrics, 2007, 70 ( 3 ) : 739 - 758.
  • 9Huang Z,Chen H,Yip A,Ng G,Guo F,Chen Z K,Roco M C. Longitudinal patent analysis for nanoscale science and engineering: Country, institution and technology field [ J ]. Journal of Nanoparticle Research, 2003, 5 ( 3 -4): 333 - 363.
  • 10Li X, Lin Y, Chen H, Roco MC. Worldwide nanotech- nology development: a comparative study of USPTO, EPO, and JPO patents (1976 - 2004) [ J]. Journal of Nanoparticle Research, 2007, 9(6): 977 - 1002.

共引文献62

同被引文献53

  • 1唐炜,刘细文.纳米科技领域授权发明专利国际比较[J].高科技与产业化,2005,11(5):44-47. 被引量:4
  • 2方曙,张娴,肖国华.专利情报分析方法及应用研究[J].图书情报知识,2007,24(4):64-69. 被引量:112
  • 3A L Porter,W B Ashton G Clar,et al. Technology Futures Anal- ysis: Toward Integration of the Field and New Methods [ J ]. Technological Forecasting and Social Change,2004,71 ( 3 ) : 287 -303.
  • 4Dar Zenchem, Chang Pinlin, Mu Hsuanhuang, et al. Technology Forecasting Via Published Patent Applications and Patent Grants [ J]. Journal of Marine Science and Technology,2012,20 (4) : 345 -356.
  • 5Brockhoff K. Insmanents for Patent Data Analysis in Business Firms[ J]. Technovation, 1992 ( 12 ) :41-58.
  • 6Jones Harry, Twiss Brian C. Forecasting Technology for Planning Decisions [ M ]. London: Macmillan Press Ltd, 1978.
  • 7袁辉,陈艳,李红橇专利技术生命周期图示法的应用研究[J].专利文献研究,2010(5):46-50.
  • 8Ernst H. Patent Portfolios for Strategic R&D Planning [ J ]. Jourllal of Engineer Technology Manage, 1998 ( 15 ) :279-308.
  • 9Marinova D,Mcaleer M.Nanotechnology strength indicators:international rankings based on US patents[J].Nanotechnology,2003(1):1-7.
  • 10Huang Z,Chen H,Yip A,Ng G,Guo F,Chen Z-K,Roco MC.Longitudinal Patent Analysis for Nanoscale Science and Engineering:Count,Institution an d Technology Field[J].Journal of Nanoparticle Research,2009(3-4):333-363.

引证文献4

二级引证文献10

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部