基于专利分析的我国纳米发光材料及器件领域研究

Analysis on Chinese Nano Light-emitting Materials and Devices Field Based on Patent Intelligence

以德温特专利数据库收录的纳米发光材料及器件领域专利为研究对象,通过对比发达国家日本、美国的专利申请情况,对我国纳米发光材料及器件领域专利技术的申请状况、研究热点、外资企业的专利布局等进行多角度分析,以期为相关技术人员和科技管理人员提供科学依据和有益参考。

Based on the patents of Nano light - emitting materials and devices field collected by Derwent Innovation Index database, through a comparative analysis on the patent data of China, Japan and US, the quantitative analysis in this paper reveals the overall patent situation, the key R＆D fields and R＆D institutes patent distribution involving major companies as patent applicants or holders in the industry in China. The paper hopes to provide an objective statistical reference for future academic researches and innovation development for technologists and managers.