期刊文献+

铋含量的变化对Bi_xFeO_3薄膜微结构和光学性质的影响(英文)

Bismuth composition dependence of properties of Bi_x FeO_3 thin films
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摘要 通过溶胶-凝胶技术在Si衬底上制备了x从0.80增大到1.20的Bi x FeO3薄膜样品.分析了Bi元素含量的改变对BFO薄膜微结构和光学性质的影响,表明在Bi缺失和Bi过量的Bi x FeO3薄膜样品中均出现了Bi2Fe4O9杂相和铁氧化物杂相,导致Bi x FeO3薄膜晶格的菱形扭曲结构发生变化.测试得到了薄膜的拉曼散射谱和椭圆偏振光谱,拉曼散射谱反映了Bi x FeO3薄膜样品中的振动模式明显受到x取值的影响.根据椭偏数据拟合得到的结果表明折射率在波长600 nm以下范围内随着x的减小而减小.而样品的禁带宽度从2.65 eV到2.76 eV,在x为1.05和1.10时得到最大值. The Bix FeO3 films (0.80 ≤ x ≤ 1.20) were prepared by sol-gel technique on Si substrates. Effects of x variation on microstruetures and optical properties of the BixFeO3 films are reported. It is shown that in the films with both insuffi- cient and excess bismuth dosage, impurity phases such as Bi2 Fe4 09 and iron oxide appeared. Raman spectra of the films were presented in the spectral range of 50 - 800 cm^ -1. The refractive index (n) of the films decreases with increasing x at wavelength lower than 600 nm, the extinction coefficients (k) of all films were comparable. The bandgaps of the films changed from 2.65 eV to 2.76 eV.
出处 《红外与毫米波学报》 SCIE EI CAS CSCD 北大核心 2014年第1期19-22,35,共5页 Journal of Infrared and Millimeter Waves
基金 Supported by National Natural Science Foundation of China(60990312 61076060) Science and Technology Commission of Shanghai Municipality(10JC1404600)
关键词 BixFeO3薄膜 溶胶-凝胶技术 微结构 光学性质 BixFeO3 thin film sol-gel technique microstructures optical properties
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