组合电路中延迟故障的功能测试生成

Functional Test Generation for Delay Faults in Combinational Circuts

提出一种用于测试组合电路中延迟故障的新功能故障模型 ,讨论该模型的功能测试生成 .实验表明 。

This paper propose a functional fault for delay faults in combinational circuits and describe a functional test generation procedure based on this model. The experiments indicate that functional test sets may be able to identify functions whose realizations have low path delay fault coverage.