期刊文献+

下一代光学掩模制造技术 被引量:3

The Fabrication Technique for Next Generation Photomask
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摘要 尽管其它光刻技术在不断快速发展,然而在0.13μm及0.13μm以下集成电路制造水平上,光学光刻仍然具有强大的生命力。随着光学光刻极限分辨率的不断提高,当代光学掩模制造技术面临着越来越严重的挑战。本文对下一代光学掩模工艺技术的技术指标和面临的技术困难进行了论述,并对其中一些关键的技术解决方案进行了简要分析。 Optical lithography will be still very strong for 0. 13um Integrated Circuits and below, even though other lithography techniques are still being developed rapidly, With the continuous improvement of optical lithography limit resolution, The current photomask fabrication technique is facing with more and more serious challenge. In this paper, The technology guideline and the technology difficulty for next generation photomask processes are discussed, and some pivotal technology resolving projects are also analysed briefly.
作者 谢常青
出处 《微电子技术》 2000年第6期1-4,共4页 Microelectronic Technology
关键词 光学光刻 光学邻近效应 移相掩模 光学掩模 制造技术 nm optical lithography 157um optical lithography Optical proximity correction Phase - shift mask
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参考文献5

  • 1V. Liberman,T. Mbloomstein and M. Rothschild et al.Materials issues for optical compontsand photomasked in 157um lithography[].Journal of Vacuum Science and Technology.1999
  • 2P. Buck and B. Grenon.Photomask technogyand development[].Proceedings of SPIE the International Society for Optical Engineering.1993
  • 3Jung - Min Sohn,Byung -Gook Kim,Sung Woon Choi etal.Process Technology for next generation Photomask[].Japanese Journal of Applied Physics.1998
  • 4M. Rothschild,J. A. Burns,S. G. Cann etal.How Practical is 193urn lithography J[].Journal of Vacuum Science and Technology.1996
  • 5M. D. Levenson.Wavfront engineering for photolithography[].Physics Today.1993

同被引文献21

  • 1张鸿海,胡晓峰,范细秋,刘胜.纳米压印光刻技术的研究[J].华中科技大学学报(自然科学版),2004,32(12):57-59. 被引量:12
  • 2徐键,夏海平,张约品,章践立,王金浩.用光刻、软刻和氧化硅球晶体模板制备表面微结构[J].无机材料学报,2005,20(1):193-198. 被引量:2
  • 3张涛.用修正的直方图法进行实时视频图像分割[J].光学精密工程,1994,2(5):93-97. 被引量:5
  • 4张瑞,陈淼,薛群基,管飞,梁山.微接触印刷法直接制备图案化TiO_2薄膜[J].高等学校化学学报,2005,26(5):939-941. 被引量:2
  • 5陈伟明.图像对准系统中图像处理和标记图形的研究[C]..第11届三束会议论文集[C].,2001.212-215.
  • 6M.L.Schattenburg,C.Chen.Sub-lOOnm metrology using interferometrically producted fiducials[C]. J.Vac.Sci.Technol.B17(6),Nov/Dec 1999. 2692-2697.
  • 7Carl G. Chen, Paul T.Konlola. Image metrology and system controls for scanning beam interference lithography [C]. J.Vac.Sci.Technol.B 19(6),Nov/Dec 2001. 2335-2341.
  • 8Hideki Ina, Koichi Sentoku. Alignment mark optimization to reduce tool- and wafer-induced shift for[J]. XRA-1000 Jpn.J.Appl.Phys, 1999, 38: 7065-7070.
  • 9M.Nelson, J.L.Kreuzer, etc. Design and test of a through-the-mask alignment sensor for a vertical stage x-ray aligner[C]. J.Vac.Sci.Technol.B12(6), Nov/Dec 1994. 3251-3255.
  • 10K.Simon, F.Gabeli. Evaluation of an advanced submicron x-ray x-ray stepper pattern transfer and alignment accuracy[J]. Microelectronic Engineering, 1991, (13):309-314.

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