期刊文献+

电阻噪声实验教学系统设计与实现 被引量:7

Design and Implementation of the Resistor Noise Experimental Teaching System
下载PDF
导出
摘要 设计了一套便携式电阻噪声实验教学系统。对电阻的1/f噪声和热噪声进行了理论分析,提出了利用惠斯通电桥构成电阻噪声测量电路,并论证了电桥测量电阻噪声的可行性。介绍了系统的组成框架,电路输出的电阻噪声经过低噪声差动放大器放大,再由USB数据采集卡采集并传输给上位机;上位机采用Labview软件实现对噪声数据的读取和分析,对数据进行FFT变换和功率谱计算,从而观察到了电阻噪声的特性。为了观察和记录实验过程,利用Labview提供的IMAQ Vision视觉模块,结合USB摄像头实现了视频显示和录制。经测试,该系统能快速检测出电阻噪声信号,并观测到电阻1/f噪声和热噪声的特性,可满足实验教学要求。 In order to easily observe the resistor noise during teaching and experimental process,a portable resistor noise observation system is designed in this paper.The theory of 1/f noise and thermal noise is anlyzed,a circuit constituted by Wheatstone bridge is proposed to measure resistor noise.A brief introduction to the framework of the system is given:the signal outputted from circuit is amplified by a low-noise differential amplifier,then is collected by USB data acquisition card and transmited to PC; Labview software is used to read the sampling data,analyze the characteristics of the thermal noise and 1/f noise through the FFT transform and power spectrum computing,and observe the characteristics of noise.In order to observe and record the experiment process,we use Labview IMAQ Vision visual module and USB camera to achieve the video display and recording.Tests show that the system can quickly detect resistor noise and reflect noise characteristics and meets the experimental and teaching requirements.
出处 《实验室研究与探索》 CAS 北大核心 2014年第1期89-93,109,共6页 Research and Exploration In Laboratory
基金 上海交通大学985三期建设项目
关键词 热噪声 1/f噪声 电阻电桥 USB数据采集卡 USB摄像头 thermal noise 1/f noise resistor bridge USB acquisition card USB camera
  • 相关文献

参考文献15

  • 1Rumyantsev S L, Pala N, Shur M S, et al. Tllin n-GaN films with low level of 1/f noise[J]. Electronics Letters, 2001, 37( 11 ) : 720- 721.
  • 2孙鹏,杜磊,何亮,陈文豪,刘玉栋,赵瑛.基于1/f噪声变化的pn结二极管辐射效应退化机理研究[J].物理学报,2012,61(12):534-540. 被引量:2
  • 3辛茜,曾晓洋,张国权,郭亚炜.基于电阻热噪声的真随机数发生器设计[J].微电子学与计算机,2004,21(7):143-146. 被引量:13
  • 4庄奕琪,马中发,杜磊.1/f噪声之谜[J].世界科技研究与发展,1999,21(4):69-72. 被引量:5
  • 5lzpura J I. On the electrical origin of flicker noise in vacuum devices [ J ]. Instrumentation and Measurement, IEEE Transactions on, 2009, 58(10) : 3592-3601.
  • 6高晋占.信号微弱检测[M].2版.北京:清华大学出版社.2011:13.
  • 7lzpura Torres J I. l/f electrical noise in planar resistors: the joint effect of a backgating noise and an instrumental disturbance [ J ]. IEEE Transactions on Instrumentation and Measurement, 2008, 57 (3) : 509-517.
  • 8周求湛,张彦创,周承鹏,吴丹娥.1/f噪声的精确测量及其在太阳能电池可靠性筛选中的应用[J].光学精密工程,2012,20(3):625-631. 被引量:10
  • 9Jevtic M M, Hadzi-Vukovic J. Low frequency noise as a tool for diagnostic of ESD degraded GaAs mesfets [ J ]. Journal of Optoelectronics and Advanced Materials, 2009, 11 (2): 155-163.
  • 10Scofield J H. ac method for measuring low-frequency resistance fluctuation spectra[J]. Review of Scientific Instruments, 1987, 58 (6) : 985-993.

二级参考文献40

  • 1须文波,施小勇,杨朝龙.基于LabVIEW的远程测控系统的设计与实现[J].微计算机信息,2006,22(11S):211-213. 被引量:13
  • 2蔡建文,李萍萍,徐传明,黄文浩.太阳电池测试系统及其参数匹配优化研究[J].光学精密工程,2007,15(4):517-521. 被引量:9
  • 3P.E.Allen,D.R.Holberg. CMOS Analog Circuit Design,2nd,Publishing House of Electronics Industry,2002.6
  • 4L. Sumanen,M.Waltari,K.Halonen. A Mismatch Insensitive CMOS Dynamic Comparator for Pipeline A/D Converters,in Proc. ICECS ' 00,Dec.2000,pp.I-32-35.
  • 5A Shoval, D A Johns,and W M Snelgrove, Median-Based Offset Cancellation Cicuit Technique, Proc. IEEE Int.Symup. Circuits and Systems, 1992, vol. 4, pp. 2033-2036
  • 6M.Bucci,L. German, R.Luzzi,P.Tommasino,A.Trifiletti,M.Varanonuovo. A High Speed Truly IC Random Number Souce for Smart Card Microcontrollers, Electronics, Circuits and Systems, 2002, 9th International Conference on, Sept.2002, 1(15-18): 239-242
  • 7肖国镇等,伪随机序列及其应用,国防工业出版社,1985.辛茜硕士研究生.研究方向为模拟/混合信号集成电路.
  • 8[1] LabVIEW Function and VI Reference Manual[M]. National Instruments Corporation,1998.
  • 9GEOFFREY K.Solar Cells and Their Applications.[M].2nd ed.Canada,New Jersey: John Wiley & Sons,Inc,2010.
  • 10VANDAMME L K J,ALABEDRA R,ZOMMITI M.1/f noise as a reliability estimation for solar cells[J].Solid-State Electronics,1983,26(7): 671-674.

共引文献69

同被引文献92

引证文献7

二级引证文献23

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部