摘要
提出了一种基于颜色分光的电子散斑干涉瞬态三维变形测量方法。该方法采用红绿蓝3种波长的激光器作为光源,采用一个彩色CCD采集来自3路的散斑干涉图像。利用颜色分光实现物体面内竖直方向、水平方向以及离面方向的散斑干涉图象信息的分离,并采用小波变换算法对散斑干涉条纹图进行处理,分别解调出各个方向的变形场相位,实现三维变形场的测量。计算机模拟和实验结果表明,该方法可以同时实现物体面内竖直方向、水平方向以及离面方向的变形测量,适用于物体表面的瞬态三维变形测量,也可实现面内和离面二维变形的独立测量。
This paper presents a transient three-dimensional deformation measurement method with color splitting based electronic speckle pattern interferometry (ESPI).The method takes red,green and blue wavelength lasers as the light sources,uses a color CCD to capture the speckle interference images from three light paths.The color light is used to achieve the separation of the speckle interference image information in the in-plane vertical direction,in-plane horizontal direction and out-of-plane direction of the object.The wavelet transform algorithm is applied to process the speckle interference fringe pattern and demodulate the deformation field phases in various directions separately,and the three-dimensional deformation field measurement is realized.Computer simulation and experiment results show that the proposed method can achieve the deformation measurements of an object in the in-plane vertical,in-plane horizontal and out-of-plane directions simultaneously,is suitable for the transient three-dimensional deformation measurement of the object surface,and also can be used to realize the independent measurements of the inplane and out-of-plane two-dimensional deformations.
出处
《仪器仪表学报》
EI
CAS
CSCD
北大核心
2014年第3期656-663,共8页
Chinese Journal of Scientific Instrument
关键词
电子散斑干涉
颜色分光
小波变换
三维变形测量
electronic speckle pattern interferometry (ESPI)
color splitting
wavelet transform (WT)
three-dimensional deformation measurement